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udev: Improve testability and tests #582
udev: Improve testability and tests #582
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Thanks @diconico07! Can we add a test of trying to insert a device that has already been inserted (namely the upper most parent) just to ensure there is no duplication in the case where a second udev rule matches with the same device as the first. |
Thanks @kate-goldenring you just found a missing piece in the implementation 😅 . |
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@diconico07 feel free to bump the version and merge whenever |
As indicated in project-akri#564 the new grouping behavior could get more test coverage. This commit moves the grouping logic to a separate function and adds relevant tests. Signed-off-by: Nicolas Belouin <nicolas.belouin@suse.com>
This commit prevents duplicate device node from being listed when multiple rules match the same devices. This fixes a regression introduced by project-akri#564. Signed-off-by: Nicolas Belouin <nicolas.belouin@suse.com>
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Signed-off-by: Nicolas Belouin <nicolas.belouin@suse.com>
Signed-off-by: Nicolas Belouin <nicolas.belouin@suse.com>
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What this PR does / why we need it:
As indicated in #564 the new grouping behavior could get more test coverage.
This PR moves the grouping logic to a separate function and adds relevant tests.
Special notes for your reviewer:
If applicable:
cargo fmt
)cargo build
)cargo clippy
)cargo test
)cargo doc
)